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Date: Thu, 10 Nov 2016 21:23:29 +0100
From: magnum <>
Subject: Re: USB-FPGA development

On 2016-11-09 23:11, Solar Designer wrote:
> On Wed, Oct 12, 2016 at 05:13:51PM +0000, wrote:
>> 2.3. I've implemented a warning when mask is too short and that results in performance degradation because USB 2.0 link has no enough bandwith. The warning appears during self-test and it looks confusing. How can format know when self-test is running, to suppress the warning?
> Oh, so this is why I saw that spurious warning.
> I think yes, you can detect self-test, but I'd rather someone else
> (more familiar with jumbo specific) answers this.  magnum, Jim?

You can test for bench_running (declare it as extern volatile int). It 
will be true during self-test as well as benchmarking.

>> Is it planned to add usage of mask in self-test?

You can use '-test -mask' for benchmarking (optionally with a mask of 
choice), but it won't (yet) test/verify proper functionality (self tests 
are skipped).


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